This part of IEC 60747 specifies the terminology, the essential ratings and characteristics, the measuring methods and the quality evaluations of light emitting diodes (LEDs) for general industrial applications such as signals, controllers, sensors, etc. LEDs for lighting applications are out of the scope of this part of IEC 60747. The types of LED are divided into the following five classes: a) LED package; b) LED flat illuminator; c) LED numeric display and alpha-numeric display; d) LED dot-matrix display; e) I LED (infrared-emitting diode). LEDs with a heat spreader or having a terminal geometry that performs the function of a heat spreader are within the scope of this part of IEC 60747. An integration of LEDs and controlgears, integrated LED modules, semi-integrated LED modules, integrated LED lamps or semi-integrated LED lamps, are out of the scope of this part of IEC 60747.
IEC 60747-5-6:2016 Referenced Document
IEC 60051-1:2016 Direct acting indicating analogue electrical measuring instruments and their accessories - Part 1: Definitions and general requirements common to all parts
IEC 60051-2:1984 Direct acting indicating analogue electrical measuring instruments and their accessories. Part 2 : Special requirements for amperemeters and voltmeters
IEC 60051-3:1984 Direct acting indicating analogue electrical measuring instruments and their accessories. Part 3 : Special requirements for wattmeters and varmeters
IEC 60051-4:1984 Direct acting indicating analogue electrical measuring instruments and their accessories. Part 4 : Special requirements for frequency meters
IEC 60051-5:1985 Direct acting indicating analogue electrical measuring instruments and their accessories. Part 5: Special requirements for phase meters, power factor meters and synchroscopes.
IEC 60051-6:1984 Direct acting indicating analogue electrical measuring instruments and their accessories. Part 6 : Special requirements for ohmmeters (impendance meters) and conductance meters
IEC 60051-7:1984 Direct acting indicating analogue electrical measuring instruments and their accessories. Part 7 : Special requirements for multi-function instruments
IEC 60051-8:1984 Appareils mesureurs electriques indicateurs analogiques a action directe et leurs accessoires Huiteme partie: Precriptions particulieres pour les accessoires (Edition 4.0)
IEC 60051-9:1988 Direct acting indicating analogue electrical measuring instruments and their accessories; part 9: recommended test methods
IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
IEC 60749-10:2002 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
IEC 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
IEC 60749-14:2003 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
IEC 60749-15:2010 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
IEC 60749-20:2008 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
IEC 60749-21:2011 Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
IEC 60749-24:2005 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
IEC 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
IEC 60749-36:2003 Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
IEC 60749-6:2002 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
ISO 2859:1974 Sampling procedures and tables for inspection by attributes