IEC 60749-24:2005
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

Standard No.

IEC 60749-24:2005

Release Date

2005

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 60749-24:2005

Scope

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelera

IEC 60749-24:2005 history

• 2005 IEC 60749-24:2005 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
• 2004 IEC 60749-24:2004 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (Edition 1.0; Replaces IEC PAS 62336:2002)