IEC 60749-12:2002
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Standard No.

IEC 60749-12:2002

Release Date

2002

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced

Replace By

IEC 60749-12:2002/COR1:2003

Latest

IEC 60749-12:2017

Replace

IEC 47/1536A/CDV:2000 IEC 47/1606/FDIS:2002 IEC 60749:1996 IEC 60749 AMD 1:2000 IEC 60749 AMD 2:2001 IEC 60749 Edition 2.2:2002 IEC/PAS 62187:2000

Scope

This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. In general, this variable frequency vibration test is in conformity with IEC 60068-2-6 but, due to specific requirements of semiconductors, the clauses of this standard apply.

IEC 60749-12:2002 history

• 2017 IEC 60749-12:2017 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
• 2003 IEC 60749-12:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
• 2002 IEC 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency