GB/T 26071-2010
Mono-crystalline silicon as cut slices for photovoltaic solar cells (English Version)

Standard No.

GB/T 26071-2010

Language

Chinese, Available in English version

Release Date

2011

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Status

Be replaced 2019-06

Replace By

GB/T 26071-2018

Latest

GB/T 26071-2018

Scope

This standard specifies the technical requirements, test methods, inspection rules and signs, packaging, transportation, storage, quality certificate and order form for solar cells. This standard applies to diced silicon single crystal slices for terrestrial solar cells prepared by the Czochralski method (CZ/MCZ).

GB/T 26071-2010 Referenced Document

• GB/T 11073 Standard method for measuring radial resistivity variation on silicon slices
• GB/T 14140 Test method for measuring diameter of semiconductor wafer
• GB/T 14264 Semiconductor materials-Terms and definitions
• GB/T 1550 Test methods for conductivity type of extrinsic semiconducting materials*， 2018-12-28 Update
• GB/T 1552 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
• GB/T 1555 Method for Determination of Crystalline Orientation of Semiconductor Single Crystal*， 2023-08-06 Update
• GB/T 25076 Monocrystalline silicon for solar cell*， 2018-09-17 Update
• GB/T 26068 Measurement of Carrier Recombination Lifetime of Silicon Wafer and Ingot Non-contact Microwave Reflection Photoconductivity Decay Method*， 2019-11-01 Update
• GB/T 2828.1 Inspection procedure by count sampling part 1: Lot by lot inspection sampling plan retrieved by acceptance quality limit (AQL)*， 2013-02-15 Update
• GB/T 6616 Non-contact eddy current method for testing semiconductor wafer resistivity and semiconductor film sheet resistance*， 2023-08-06 Update
• GB/T 6618 Test method for thickness and total thickness variation of silicon slices
• GB/T 6620 Test method for measuring warp on silicon slices by noncontact scanning

GB/T 26071-2010 history

• 2018 GB/T 26071-2018 Monocrystalline silicon wafers for solar cells
• 2011 GB/T 26071-2010 Mono-crystalline silicon as cut slices for photovoltaic solar cells

GB/T 26071-2010 Mono-crystalline silicon as cut slices for photovoltaic solar cells was changed to CTI STD-137-2013 Fiberglass Pultruded Structural Products for Use in Cooling Towers.