GB/T 30858-2014 (English Version) PDF

Standard No.: GB/T 30858-2014
Language: Chinese, Available in English version
Release Date: 2014
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 30858-2014

Scope: This standard specifies the requirements, test methods, inspection rules, marking, packaging, transportation, storage, quality certificate and purchase order (or contract) content of polished sapphire single crystal substrates. This standard applies to single-sided polished sapphire substrates (hereinafter referred to as sapphire substrates).

GB/T 30858-2014 Referenced Document

GB/T 1031 Geometrical Product Specifications(GPS).Surface texture:Profile method.Surface roughness parameters and their values
GB/T 13387 Test method for measuring flat length wafers of silicon and other electronic materials
GB/T 14140 Test method for measuring diameter of semiconductor wafer
GB/T 14264 Semiconductor materials-Terms and definitions
GB/T 1555 Method for Determination of Crystalline Orientation of Semiconductor Single Crystal*， 2023-08-06 Update
GB/T 19921 Test method for particles on polished silicon wafer surfaces*， 2018-12-28 Update
GB/T 2828.1 Inspection procedure by count sampling part 1: Lot by lot inspection sampling plan retrieved by acceptance quality limit (AQL)
GB/T 30857 Standard test method for thickness and thickness variation on sapphire substrates
GB/T 6619 Test method for bow of silicon wafers
GB/T 6620 Test method for measuring warp on silicon slices by noncontact scanning
GB/T 6624 Standard method for measuring the surface quality of polished silicon slices by visual inspection