GB/T 29055-2012
Multi-crystalline silicon wafer for solar cell (English Version)
- Standard No.
- GB/T 29055-2012
- Language
- Chinese, Available in English version
- Release Date
- 2012
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Status
- 2020-05
- Replace By
- GB/T 29055-2019
- Latest
- GB/T 29055-2019
- Scope
- This standard specifies the term definitions, symbols and abbreviations, product classifications, technical requirements, test methods, inspection rules, signs, packaging, transportation and storage of polycrystalline silicon wafers for solar cells. This standard applies to polycrystalline silicon wafers for solar cells produced by ingot polycrystalline slices perpendicular to the crystal growth direction.
GB/T 29055-2012 Referenced Document
- GB/T 14264 Semiconductor materials-Terms and definitions
- GB/T 1550 Test methods for conductivity type of extrinsic semiconducting materials*， 2018-12-28 Update
- GB/T 1551 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method*， 2021-05-21 Update
- GB/T 2828.1 Inspection procedure by count sampling part 1: Lot by lot inspection sampling plan retrieved by acceptance quality limit (AQL)*， 2013-02-15 Update
- GB/T 29054 Casting multi crystalline silicon brick for photovoltaic solar cell*， 2019-06-04 Update
- GB/T 6616 Non-contact eddy current method for testing semiconductor wafer resistivity and semiconductor film sheet resistance*， 2023-08-06 Update
- GB/T 6618 Test method for thickness and total thickness variation of silicon slices
- GB/T 6619 Test method for bow of silicon wafers
GB/T 29055-2012 history
- 2019 GB/T 29055-2019 Multicrystalline silicon wafers for photovoltaic solar cell
- 2012 GB/T 29055-2012 Multi-crystalline silicon wafer for solar cell
