GB/T 25184-2010 (English Version) PDF

Standard No.: GB/T 25184-2010
Language: Chinese, Available in English version
Release Date: 2010
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 25184-2010

Scope: This standard specifies the verification method for X-ray photoelectron spectrometer. This standard applies to the verification of X-ray photoelectron spectrometers using non-monochromatic Al or Mg X-rays or monochromatic Al X-rays and equipped with ion guns for sputter cleaning.

GB/T 25184-2010 Referenced Document

GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 20175-2006 Surface chemical analysis.Sputter depth profiling.Optimization using layered systems as reference materials
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 22461-2008 Surface chemical analysis.Vocabulary
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
GB/T 25185-2010 Surface chemical analysis.X-ray photoelectron spectroscopy.Reporting of methods used for charge control and charge correction
ISO 18116 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
ISO 18118:2004 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
ISO 24237 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale