DIN EN 50513:2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing; German version EN 50513:2009
DIN 5043-2 Radioactive luminescent pigments and paints; method of measurement of luminance and designation of luminescent paints
DIN 50431 Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array
DIN 50434 Testing of materials for semiconductor technology; detection of crystal defects in monocrystalline silicon using etching techniques on {111} and {100} surfaces
DIN 50438-1 Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen
DIN 50438-2 Testing of materials for semiconductor technology; determination of impurty content in silicon by infrared absorption; carbon
DIN 50441-1 Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 1: Thickness and thickness variation
DIN 50441-5 Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 5: Terms of shape and flatness deviation
DIN 879-1 Verification of geometrical parameters - Dial indicator for linear mesurement - Part 1: With mechanical indication
EN 50461 Solar cells Datasheet information and product data for crystalline silicon solar cells
EN ISO/IEC 17025 General requirements for the competence of testing and calibration laboratories*, 2017-12-01 Update
DIN EN 50513:2009 history
2009DIN EN 50513:2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing; German version EN 50513:2009
0000 DIN EN 50513:2008
2007DIN V VDE V 0126-18-4-2:2007 Solar wafers - Part 4-2: Process for measuring the electrical characteristics of silicon - Minority carrier lifetime, Laboratory measuring method