DIN 50431:1988
Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array
- Standard No.
- DIN 50431:1988
- Release Date
- 1988
- Published By
- German Institute for Standardization
- Status
- Latest
- DIN 50431:1988
- Scope
- The standard determines a test method for the measurement of the electrical resistivity of silicon or germanium single crystals by means of the four-point-probe direct current method with collinear four probe array.
DIN 50431:1988 history
- 1988 DIN 50431:1988 Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array
