This part specifies the test method for solid content in precious metal slurries for microelectronics technology. This section applies to the determination of the solid content of precious metal pastes for various sintered and cured microelectronics technologies.
GB/T 17473.1-2008 Referenced Document
GB/T 8170 Rules of rounding off for numerical values & expression and judgement of limiting values*, 2008-07-16 Update
GB/T 17473.1-2008 history
2008GB/T 17473.1-2008 Test method of precious metals pastes used for microelectronics.Determination of solids content
1998GB/T 17473.1-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of solids content