GB/T 17473.1-1998
Test methods of precious metal pastes used for thick film microelectronics--Determination of solids content (English Version)
- Standard No.
- GB/T 17473.1-1998
- Language
- Chinese, Available in English version
- Release Date
- 1998
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Status
- 2008-09
- Replace By
- GB/T 17473.1-2008
- Latest
- GB/T 17473.1-2008
- Scope
- This standard specifies the test method for solid content in precious metal slurries. This standard applies to the determination of solid content in various precious metal slurries. The determination of solid content in non-precious metal slurry can also be used by reference.
GB/T 17473.1-1998 history
- 2008 GB/T 17473.1-2008 Test method of precious metals pastes used for microelectronics.Determination of solids content
- 1998 GB/T 17473.1-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of solids content
GB/T 17473.1-1998 -All Parts
GB/T 17473.1-2008 Test method of precious metals pastes used for microelectronics.Determination of solids content
GB/T 17473.2-2008 Test method of precious metals pastes used for microelectronics.Determination of fineness
GB/T 17473.3-2008 Test method of precious metals pastes used for microelectronics.Determination of sheet resistance
GB/T 17473.4-2008 Test methods of precious metals pastes used for microelectronics.Determination of adhesion
GB/T 17473.5-2008 Test method of precious metals pastes used for microelectronics.Determination of viscosity
GB/T 17473.6-2008 Test method of precious metals pastes used for microelectronics.Determination of resolution
GB/T 17473.7-2022 Test methods of precious metals pastes used for microelectronics—Part 7: Determination of solderability and solder leaching resistance