GB/T 17473.6-2008
Test method of precious metals pastes used for microelectronics.Determination of resolution (English Version)

Standard No.

GB/T 17473.6-2008

Language

Chinese, Available in English version

Release Date

2008

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 17473.6-2008

Replace

GB/T 17473.6-1998

Scope

This part specifies the determination method for the resolution of precious metal pastes used in microelectronics technology. This section applies to the determination of the resolution of precious metal pastes used in microelectronics technology.

GB/T 17473.6-2008 Referenced Document

• GB/T 8170 Rules of rounding off for numerical values & expression and judgement of limiting values*， 2008-07-16 Update

GB/T 17473.6-2008 history

• 2008 GB/T 17473.6-2008 Test method of precious metals pastes used for microelectronics.Determination of resolution
• 1998 GB/T 17473.6-1998 Test methods of precious metal pastes used for thick-film microelectronics--Determination of resolution

GB/T 17473.6-2008 -All Parts