GB/T 17473.2-1998
Test methods of precious metal pastes used for thick film microelectronics--Determination of fineness (English Version)
- Standard No.
- GB/T 17473.2-1998
- Language
- Chinese, Available in English version
- Release Date
- 1998
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Status
- 2008-09
- Replace By
- GB/T 17473.2-2008
- Latest
- GB/T 17473.2-2008
- Scope
- This standard specifies the scraper test method for the fineness of precious metal pastes. This standard applies to the determination of the fineness of precious metal paste. The fineness measurement of non-precious metal paste can also be used as a reference.
GB/T 17473.2-1998 history
- 2008 GB/T 17473.2-2008 Test method of precious metals pastes used for microelectronics.Determination of fineness
- 1998 GB/T 17473.2-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of fineness
GB/T 17473.2-1998 -All Parts
GB/T 17473.1-2008 Test method of precious metals pastes used for microelectronics.Determination of solids content
GB/T 17473.2-2008 Test method of precious metals pastes used for microelectronics.Determination of fineness
GB/T 17473.3-2008 Test method of precious metals pastes used for microelectronics.Determination of sheet resistance
GB/T 17473.4-2008 Test methods of precious metals pastes used for microelectronics.Determination of adhesion
GB/T 17473.5-2008 Test method of precious metals pastes used for microelectronics.Determination of viscosity
GB/T 17473.6-2008 Test method of precious metals pastes used for microelectronics.Determination of resolution
GB/T 17473.7-2022 Test methods of precious metals pastes used for microelectronics—Part 7: Determination of solderability and solder leaching resistance