IEC 60749:1996
Semiconductor devices - Mechanical and climatic test methods

Standard No.

IEC 60749:1996

Release Date

1996

Published By

International Electrotechnical Commission (IEC)

Status

Withdraw 2002-04

Replace By

IEC 60749/AMD1:2000

Latest

IEC 60749:2002

Replace

IEC 47/1394/FDIS:1996 IEC 60749:1984 IEC 60749 AMD 1:1991 IEC 60749 AMD 2:1993

IEC 60749:1996 history

• 2002 IEC 60749:2002 Semiconductor devices - Mechanical and climatic test methods
• 2001 IEC 60749/AMD2:2001 Semiconductor devices - Mechanical and climatic test methods; Amendment 2
• 2000 IEC 60749/AMD1:2000 Semiconductor devices - Mechanical and climatic test methods; Amendment 1
• 1996 IEC 60749:1996 Semiconductor devices - Mechanical and climatic test methods
• 1993 IEC 60749/AMD2:1993 Semiconductor devices; mechanical and climatic test methods; amendment 2
• 1991 IEC 60749/AMD1:1991 Semiconductor devices; mechanical and climatic test methods; amendment 1
• 1984 IEC 60749:1984 Semiconductor devices. Mechanical and climatic test methods