2002IEC 60749:2002 Semiconductor devices - Mechanical and climatic test methods
2001IEC 60749/AMD2:2001 Semiconductor devices - Mechanical and climatic test methods; Amendment 2
2000IEC 60749/AMD1:2000 Semiconductor devices - Mechanical and climatic test methods; Amendment 1
1996IEC 60749:1996 Semiconductor devices - Mechanical and climatic test methods
1993IEC 60749/AMD2:1993 Semiconductor devices; mechanical and climatic test methods; amendment 2
1991IEC 60749/AMD1:1991 Semiconductor devices; mechanical and climatic test methods; amendment 1
1984IEC 60749:1984 Semiconductor devices. Mechanical and climatic test methods
IEC 60749/AMD1:1991 Semiconductor devices; mechanical and climatic test methods; amendment 1 was changed to IEC 60749:1996 Semiconductor devices - Mechanical and climatic test methods.