GB/T 17626.4-2018
Electromagnetic compatibility－Testing and measurement techniques－Electrical fast transient/burst immunity test (English Version)

Standard No.

GB/T 17626.4-2018

Language

Chinese, Available in English version

Release Date

2018

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 17626.4-2018

Replace

GB/T 17626.4-2008

Scope

This part of GB/T 17626 deals with the immunity requirements and test methods of electrical and electronic equipment to repetitive electrical fast transients. In addition, the range of test levels and test procedures are specified. The purpose of this standard is to determine a common reproducible basis for evaluating the performance of power supply ports, signal, control and ground ports of electrical and electronic equipment when subjected to electrical fast transient bursts. The test methods specified in this standard describe a consistent method of evaluating the immunity of equipment or systems to defined phenomena. Note: As stated in IEC Guide 107, this part is the basic standard for electromagnetic compatibility and is used by various product committees. IEC Guide 107 also stipulates that the product committee is responsible for determining whether to apply this immunity test standard and, if used, for determining the appropriate test level and performance criteria. The National Electromagnetic Compatibility Standardization Technical Committee and its sub-committees are willing to cooperate with product committees to evaluate the special immunity requirements of their products. This part specifies: --- test voltage waveform; --- range of test levels; --- test equipment; --- test equipment calibration and verification procedures; --- test arrangement; --- test procedures. This section gives technical specifications for laboratory and field tests. 0.10 0.10 0.15 40 30 probability density unit ui (y) unit -1.02 0.041 ns 1.02 0.152 ns 0.010 ns factor u (xi )2. range 0.0073 probability density unit degree distribution factor u (xi )ci unit ui (y) unit 2. Range 0.8 30 probability density unit degree distribution factor u (xi )ci unit ui (y) unit 1.73 0.462 0.328 V/MHz 0.152 V0.162 kV3.75 kV function MHz rectangle MHz rectangle 1.73 17.32 -0.0058 uc (y)=V/ MHz ∑ui (y)2 range 0.10 0.10 probability density unit degree distribution factor u (xi )2. range probability density unit 0 ns 1.5 ns B7.0 MHz 0.8 MHz 400 MHz 30 u (xi )ci unit ui (y) unit 1.00 1.50 1.00 ns 1.50 ns 1.73 0.462 0.0021 ns Function δRβ factor degree distribution MHz normal (k=1) rectangular 1.73 rectangular/MHz -0.0045 ns 17.32 8.0×10 -5 uc (y)=/MHz ns 2

GB/T 17626.4-2018 Referenced Document

• GB/T 4365-2003 Electrotechnical terminology Electromagnetic compatibility
• IEC 60050 International Electrotechnical Vocabulary (IEV) - Index

GB/T 17626.4-2018 history

• 2018 GB/T 17626.4-2018 Electromagnetic compatibility－Testing and measurement techniques－Electrical fast transient/burst immunity test
• 2008 GB/T 17626.4-2008 Electromagnetic compatibility.Testing and measurement techniques.Electrical fast transient/burst immunity test
• 1998 GB/T 17626.4-1998 Electromagnetic compatibility--Testing and measurement techniques--Electrical fast transient/burst immunity test

GB/T 17626.4-2018 -All Parts