GB/T 14620-2013
Alumina ceramic substrates for thin film integrated circuits (English Version)

Standard No.

GB/T 14620-2013

Language

Chinese, Available in English version

Release Date

2013

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 14620-2013

Replace

GB/T 14620-1993

Scope

This standard specifies the requirements, test methods, inspection rules, marking, packaging, transportation and storage of alumina ceramic substrates for thin film integrated circuits. This standard applies to the production and procurement of alumina ceramic substrates for thin film integrated circuits (hereinafter referred to as "substrates"), and alumina ceramic substrates for chip components using thin film technology can also be used as a reference.

GB/T 14620-2013 Referenced Document

• GB/T 14619-2013 Alumina ceramic substrates for thick film integrated circuits
• GB/T 16534-2009 Fine ceramics(advanced ceramics,advanced technical ceramics).Test method for hardness of monolithic ceramics at room temperature
• GB/T 1958 Geometrical Product Specifications(GPS)—Geometrical tolerance—Verification*， 2017-11-01 Update
• GB/T 2413 Piezoelectric ceramic materials--Measuring methods fordetermination of volume and density
• GB/T 2828.1 Inspection procedure by count sampling part 1: Lot by lot inspection sampling plan retrieved by acceptance quality limit (AQL)
• GB/T 2829 Sampling procedures and tables for periodic inspection by attributes (Apply to inspection of process stability)
• GB/T 5593 Structure ceramic materials used in electronic component and device*， 2015-05-15 Update
• GB/T 5594.3 Test methods for properties of structure ceramic used in electronic components and device.Part 3:Test method for mean coefficient of linear expansion*， 2015-05-15 Update
• GB/T 5594.4 Test methods for properties of structure ceramic used in electronic component and device.Part 4:Test method for permittivity and dielectric loss angle tangent value*， 2015-05-15 Update
• GB/T 5594.5 Test methods for properties of structure ceramic used in electronic components--Test method for volume resistivity
• GB/T 5594.7 Test methods for properties of structure ceramic used in electronic components and device.Part 7:Test method for liquid permeability*， 2015-05-15 Update
• GB/T 5598 Test method for thermal conductivity of beryllium oxide ceramics*， 2015-05-15 Update
• GB/T 6062 Geometrical Product Specifications(GPS).Surface texture:Profile method.Nominal characteristic of contact(stylus) instruments
• GB/T 6900 Chemical analysis of alumina silica refractories*， 2016-08-29 Update
• GB/T 9531.1 General specification for electronic ceramic parts
• GJB 1201.1-1991 Test method for high temperature thermal diffusivity of solid materials Laser pulse method
• GJB 548B-2005 Test methods and procedures for microelectronic device

GB/T 14620-2013 history

• 2013 GB/T 14620-2013 Alumina ceramic substrates for thin film integrated circuits
• 1993 GB/T 14620-1993 Alumina ceramic substrates for thin film integratedcircuits