GJB 548B-2005
Test methods and procedures for microelectronic device (English Version)

Standard No.

GJB 548B-2005

Language

Chinese, Available in English version

Release Date

2005

Published By

Military Standard of the People's Republic of China-General Armament Department

Status

Be replaced 2022-03

Replace By

GJB 548C-2021

Latest

GJB 548C-2021

Replace

GJB 548A-1996

Scope

This standard specifies the environmental, mechanical and electrical test methods and test procedures for military microelectronic devices, as well as the necessary control and restriction measures to ensure the quality and reliability of microelectronic devices meeting the requirements of the intended use. This standard applies to microelectronic devices for military and space applications. If the manufacturer indicates or claims that its semiconductor integrated circuit meets the requirements of this standard, it must meet the requirements of method 5004, 5005 or 5010 (for complex microcircuits), and hybrid integrated circuits should meet the requirements of GJB 2438 and this standard General requirements and requirements of other test methods cited, and product specifications should be confirmed by the standardization body.

GJB 548B-2005 Referenced Document

• GB/T 1036 Test method for coefficient of linear thermal expansion of plastics between -30℃ and 30℃ with a vitreous silica dilatometer *， 2008-08-04 Update
• GB/T 12842 Terminology for film integrated circuits and hybrid film integrated circuits
• GB/T 3131 Tin-lead solder*， 2020-09-29 Update
• GB/T 9178 Terminology for integrated circuits
• GB/T 9491 Flux for tin soldering*， 2021-12-31 Update
• GJB 1208 Microcircuit Certification Requirements
• GJB 1209 Test methods and procedures for microcircuit line certification
• GJB 128 Aerial photographic specification for military topographic mapping
• GJB 2438 General Specification for Hybrid Integrated Circuits
• GJB 2712 Quality assurance requirements for measuring equipment Metrological confirmation system
• GJB 597 General specification for microcircuit
• GJB 899 Reliability Qualification and Acceptance Test Modification Sheet 1-98

GJB 548B-2005 history

• 2021 GJB 548C-2021 Microelectronic device test methods and procedures
• 2005 GJB 548B-2005 Test methods and procedures for microelectronic device
• 1996 GJB 548A-1996 Microelectronic device test methods and procedures
• 1988 GJB 548-1988 Microelectronic device test methods and procedures

GJB 548B-2005 Test methods and procedures for microelectronic device has been changed from GJB 548A-1996 Microelectronic device test methods and procedures.