GB/T 5594.4-2015
Test methods for properties of structure ceramic used in electronic component and device.Part 4:Test method for permittivity and dielectric loss angle tangent value (English Version)

Standard No.: GB/T 5594.4-2015
Language: Chinese, Available in English version
Release Date: 2015
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 5594.4-2015
Replace: GB/T 5594.4-1985

Scope: This part of GB/T 5594 specifies the test methods for the dielectric constant and dielectric loss tangent of electronic ceramic materials used in device parts, vacuum electronic devices, resistor substrates, semiconductors and integrated circuit substrates. This part applies to the dielectric constant and dielectric loss tangent of electronic ceramic materials used in device parts, vacuum electronic devices, resistance substrates, semiconductors and integrated circuit substrates at a frequency of 1 MHz and a temperature ranging from room temperature to 500 °C. test.

GB/T 5594.4-2015 Referenced Document

GB/T 5593-2015 Structure ceramic materials used in electronic component and device
GB/T 9530-1988 Terms for electronic ceramics

2015 GB/T 5594.4-2015 Test methods for properties of structure ceramic used in electronic component and device.Part 4:Test method for permittivity and dielectric loss angle tangent value
1985 GB/T 5594.4-1985 Test methods for properties of structure ceramic used in electronic components--Test method for dielectric loss angle tangent value