GB/T 25074-2010 (English Version) PDF

Standard No.: GB/T 25074-2010
Language: Chinese, Available in English version
Release Date: 2010
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Status: Be replaced 2018-05
Replace By: GB/T 25074-2017
Latest: GB/T 25074-2017

Scope: This standard specifies the product classification, technical requirements, test methods, inspection rules, and packaging, marking, transportation, storage, and order (or contract) contents of solar-grade polysilicon. This standard applies to rod-shaped polysilicon, block polysilicon, and granular polysilicon products produced using (improved) Siemens method and silane method using chlorosilane as raw material. The products are mainly used in the production of solar-grade monocrystalline silicon rods and directionally solidified polycrystalline silicon ingots.

GB/T 25074-2010 Referenced Document

GB/T 1550 Test methods for conductivity type of extrinsic semiconducting materials*， 2018-12-28 Update
GB/T 1551 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method*， 2021-05-21 Update
GB/T 1553 Determination of Minority Carrier Lifetime in Silicon and Germanium by Photoconductivity Decay Method*， 2023-08-06 Update
GB/T 1557 Test method for determining interstitial oxygen content in silicon by infrared absorption*， 2018-09-17 Update
GB/T 1558 Infrared absorption test method for substituted carbon content in silicon*， 2023-12-28 Update
GB/T 24574 Test methods for photolumininescence analysis of single crystal silicon for Ⅲ-Ⅴ impurities
GB/T 24581 Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method*， 2022-03-09 Update
GB/T 4059 Test method for phosphorus content in polycrystalline silicon by zone-melting method under controlled atmosphere*， 2018-12-28 Update
GB/T 4060 Test method for boron content in polycrystalline silicon by vacuum zone-melting method*， 2018-09-17 Update
GB/T 4061 Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion