IEC 60749-12:2002/COR1:2003
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Standard No.

IEC 60749-12:2002/COR1:2003

Release Date

2003

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2017-12

Replace By

IEC 60749-12:2017

Latest

IEC 60749-12:2017

Scope

This is Technical Corrigendum 1 to IEC 60749-12-2002 (Semiconductor devices -Mechanical and climatic test methods -Part 12:Vibration, variable frequency)

IEC 60749-12:2002/COR1:2003 history

• 2017 IEC 60749-12:2017 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
• 2003 IEC 60749-12:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
• 2002 IEC 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency