IEC 60749-12:2017
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Standard No.

IEC 60749-12:2017

Release Date

2017

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 60749-12:2017

Scope

This part of IEC 60749 describes a test to determine the effect of variable frequency vibration@ within the specified frequency range@ on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103.

IEC 60749-12:2017 history

• 2017 IEC 60749-12:2017 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
• 2003 IEC 60749-12:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
• 2002 IEC 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency