GB/T 20724-2021
Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction (English Version)
- Standard No.
- GB/T 20724-2021
- Language
- Chinese, Available in English version
- Release Date
- 2021
- Published By
- 国家市场监督管理总局、中国国家标准化管理委员会
- Latest
- GB/T 20724-2021
- Replace
- GB/T 20724-2006
- Scope
- This document describes a convergent-beam electron diffraction method for the determination of the thickness of thin crystalline specimens by transmission electron microscopy/scanning transmission electron microscopy. This document is applicable to the determination of the thickness of thin crystal samples with a linear dimension ranging from tens of nanometers to hundreds of microns and a thickness ranging from tens of nanometers to hundreds of nanometers. Note: Since the thickness of thin samples in transmission electron microscopy is often not uniform, the local thickness of the sample illuminated by the electron beam is measured by the convergent beam diffraction method.
GB/T 20724-2021 Referenced Document
- GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 27418-2017 Guide to the evaluation and expression of uncertainty in measurement
- ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
GB/T 20724-2021 history
- 2021 GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
- 2006 GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
