ISO 15932:2013
Microbeam analysis.Analytical electron microscopy.Vocabulary
- Standard No.
- ISO 15932:2013
- Release Date
- 2013
- Published By
- International Organization for Standardization (ISO)
- Latest
- ISO 15932:2013
- Scope
- This International Standard defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. This International Standard is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.
ISO 15932:2013 history
- 2013 ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
