GB/T 18907-2013
Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope (English Version)

Standard No.

GB/T 18907-2013

Language

Chinese, Available in English version

Release Date

2013

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 18907-2013

Replace

GB/T 18907-2002

Scope

This standard specifies the method for the selected area electron diffraction analysis of micron and submicron sized regions of thin crystal samples by transmission electron microscopy (TEM). The samples to be tested can be obtained from thin slices of various metal or non-metallic materials, and fine powder or extracted replica samples can also be used. The minimum diameter of the selected area of the sample that can be analyzed by this method depends on the spherical aberration coefficient of the microscope objective lens. For modern TEM, the minimum diameter of the selected area of the sample can generally reach 0.5 μm. When the diameter of the sample area to be analyzed is less than 0.5 μm, the analysis method of this standard can still be referred to, but due to the influence of spherical aberration, part of the information on the diffraction spectrum may come from outside the area limited by the selected aperture. In this case, if conditions permit, it is best to use micro (nano) diffraction or convergent beam electron diffraction. The successful application of the selected area electron diffraction method depends on the correct calibration of the obtained diffraction spectrum index, regardless of which crystal zone axis of the sample is parallel to the incident electron beam. Therefore, such analysis often requires the use of sample tilt and rotating device. This standard is applicable to obtain the SAED spectrum from the crystal sample, calibrate the index of the diffraction spectrum and calibrate the diffraction constant of the electron microscope.

GB/T 18907-2013 Referenced Document

• ISO/IEC 17025 General requirements for the competence of testing and calibration laboratories [Standard in French]*， 2017-11-01 Update

GB/T 18907-2013 history

• 2013 GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
• 2002 GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes