GB/T 20724-2006
Method of thickness measurement for thin crystal by convergent beam electron diffraction (English Version)

Standard No.

GB/T 20724-2006

Language

Chinese, Available in English version

Release Date

2006

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Status

Be replaced 2022-07

Replace By

GB/T 20724-2021

Latest

GB/T 20724-2021

Scope

This standard specifies the converging beam electron diffraction method for the determination of the thickness of thin crystal specimens by transmission electron microscopy. This method is suitable for measuring the thickness of thin crystals with a linear dimension of 10^-9m to ×10^-3m and a thickness ranging from tens to hundreds of nanometers.

GB/T 20724-2006 Referenced Document

• GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes

GB/T 20724-2006 history

• 2021 GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
• 2006 GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction