ISO 22489:2016
Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
- Standard No.
- ISO 22489:2016
- Release Date
- 2016
- Published By
- International Organization for Standardization (ISO)
- Latest
- ISO 22489:2016
ISO 22489:2016 Referenced Document
- ISO 14594:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- ISO 14595:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs)
- ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
- ISO 23833:2013 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
- ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
ISO 22489:2016 history
- 2016 ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
- 2006 ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
