GB/T 32988-2016
Synthetic quartz crystal wafer for optical low pass filter (OLPF) (English Version)

Standard No.

GB/T 32988-2016

Language

Chinese, Available in English version

Release Date

2016

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 32988-2016

Scope

This standard specifies the terms and definitions, classification, requirements, test methods, inspection rules, packaging, marking, and delivery conditions of artificial quartz optical low-pass filter chips. This standard applies to artificial quartz optical low-pass filter chips.

GB/T 32988-2016 Referenced Document

• GB/T 1185 Surface imperfections of optical elements
• GB/T 2828.1-2012 Inspection procedure by count sampling part 1: Lot by lot inspection sampling plan retrieved by acceptance quality limit (AQL)
• GB/T 2831 Surface form deviation of optical elements
• GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices
• GB/T 7895 Optical grade synthetic quartz crystal
• GB/T 7896-2008 Test method for optical grade synthetic quartz crystal

GB/T 32988-2016 history

• 2016 GB/T 32988-2016 Synthetic quartz crystal wafer for optical low pass filter (OLPF)