GB/T 20726-2015 (English Version) PDF

Standard No.: GB/T 20726-2015
Language: Chinese, Available in English version
Release Date: 2015
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 20726-2015
Replace: GB/T 20726-2006

Scope: This standard specifies the most important performance parameters characterizing the characteristics of X-ray energy spectrometers (EDS) which are based on semiconductor detectors, preamplifiers and signal processing systems. This standard applies only to semiconductor detector energy spectrometers based on the principle of solid-state ionization. This standard specifies the minimum requirements and verification methods for EDS performance parameters used in conjunction with scanning electron microscopy (SEM) or electron probe (EPMA). As for the actual analysis process, already specified in ISO 22309 and ASTM E1508, it is outside the scope of this standard.

GB/T 20726-2015 Referenced Document

GB/T 21636-2008 Microbeam analysis.Electron probe microanalysis (EPMA).Vocabulary

2015 GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
2006 GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors