BS EN 62149-2:2014
Fibre optic active components and devices. Performance standards. 850 nm discrete vertical cavity surface emitting laser devices

Standard No.

BS EN 62149-2:2014

Release Date

2014

Published By

British Standards Institution (BSI)

Latest

BS EN 62149-2:2014

Replace

BS EN 62149-2:2009

BS EN 62149-2:2014 Referenced Document

• EN 60191 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
• EN 60747-5-1 Discrete semiconductor devices and integrated circuits — Part 5-1: Optoelectronic devices — General (includes amendments A1:2002 + A2:2002) (IEC 60747-5-1:1997 + A1:2001 + A2:2002)
• EN 60749 Semiconductor Devices - Mechanical and Climatic Test Methods (Incorporates Amendments A1: 2000 and A2: 2001)
• EN 60749-6 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature*， 2017-06-16 Update
• EN 60749-7 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
• EN 60825 Radiation Safety of Laser Products@ Equipment Classification@ Requirements and User's Guide
• EN 60825-1 Safety of laser products - Part 1: Equipment classification and requirements*， 2019-03-01 Update
• EN 60950-1 Information technology equipment - Safety Part 1: General requirements Incorporates Amendment A1: 2010
• EN 61300-2-4 Fibre Optic Interconnecting Devices and Passive Components Basic Test and Measurement Procedures Part 2-4: Tests - Fibre/Cable Retention
• IEC 60191 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
• IEC 60747-5-1 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General
• IEC 60749 Semiconductor devices - Mechanical and climatic test methods
• IEC 60749-6 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature*， 2017-03-01 Update
• IEC 60749-7 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
• IEC 60825 Safety of laser products - ALL PARTS*， 2023-05-25 Update
• IEC 60825-1 Interpretation sheet 2 - Safety of laser products - Part 1: Equipment classification and requirements*， 2017-12-19 Update
• IEC 60874 Connectors for optical fibres and cables; part 9: sectional specification for fibre optic connector; type OF-2
• IEC 60950-1 Information technology equipment - Safety - Part 1: General requirements*， 2023-12-23 Update
• IEC 61280-1-3 Fibre optic communication subsystem test procedures - Part 1-3: General communication subsystems - Measurement of central wavelength, spectral width and additional spectral characteristics*， 2021-07-05 Update
• IEC 61300-2-4 Amendment 1 - Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre or cable retention*， 2020-01-01 Update
• IEC 62007-1 Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics*， 2022-09-22 Update
• IEC 62007-2 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
• IEC 62148-1 Fibre optic active components and devices - Package and interface standards - Part 1: General and guidance*， 2017-08-31 Update
• IEC 62149-1 Fibre optic active components and devices - Performance standards - Part 1: General and guidance
• IEC Guide 107 Electromagnetic compatibility - Guide to the drafting of electromagnetic compatibility publications

BS EN 62149-2:2014 history

• 2014 BS EN 62149-2:2014 Fibre optic active components and devices. Performance standards. 850 nm discrete vertical cavity surface emitting laser devices
• 2010 BS EN 62149-2:2009 Fibre optic active components and devices - Performance standards - 850 nm discrete vertical cavity surface emitting laser devices