IEC 60749-7:2011
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
- Standard No.
- IEC 60749-7:2011
- Release Date
- 2011
- Published By
- International Electrotechnical Commission (IEC)
- Latest
- IEC 60749-7:2011
- Replace
- IEC 47/2087/FDIS:2011 IEC 60749-7:2002 IEC 60749-7 Corrigendum 1:2003
- Scope
- This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.
IEC 60749-7:2011 history
- 2011 IEC 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
- 1970 IEC 60749-7:2002/COR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
- 2002 IEC 60749-7:2002 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
