GB/T 30860-2014
Test methods for surface roughness and saw mark of silicon wafers for solar cells (English Version)

Standard No.

GB/T 30860-2014

Language

Chinese, Available in English version

Release Date

2014

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 30860-2014

Scope

This standard specifies the contact or non-contact profile test method for the surface roughness and cutting line marks of silicon wafers for solar cells (hereinafter referred to as silicon wafers). This standard applies to single crystal and polycrystalline silicon wafers produced by wire cutting process. If it needs to be applied to other products, it needs to be negotiated and agreed by the relevant parties.

GB/T 30860-2014 Referenced Document

• GB/T 1031 Geometrical Product Specifications(GPS).Surface texture:Profile method.Surface roughness parameters and their values
• GB/T 10610 Geometrical Product Specifications(GPS)Surface texture:Profile method.Rules and procedures for the assessment of surface texture
• GB/T 14264 Semiconductor materials-Terms and definitions
• GB/T 18777 Geometrical Product Specifications(GPS).Surface texture:Profile method.Metrological characteristics of phase correct filters
• GB/T 26071 Monocrystalline silicon wafers for solar cells*， 2018-09-17 Update
• GB/T 29055 Multi crystalline silicon wafers for photovoltaic solar cell*， 2019-06-04 Update
• GB/T 29505 Test method for measuring surface roughness on planar surfaces of silicon wafer
• GB/T 30859 Test method for warp and waviness of silicon wafers for solar cells
• GB/T 3505 Geometrical Product Specifications(GPS).Surface texture:Profile method.Terms,definitions and surface texture parameters
• GB/Z 26958.1 Geometrical Product Specifications (GPS).Filtration.Part 1: Overview and basic concepts
• GB/Z 26958.20 Geometrical Product Specification (GPS).Filtration.Part 20: Linear profile filters: Basic concepts
• GB/Z 26958.22 Geometrical Product Specifications (GPS).Filtration.Part 22: Linear profile filters: Spline filters
• GB/Z 26958.29 Geometrical Product Specifications (GPS).Filtration.Part 29: Linear profile filters: Spline wavelets
• GB/Z 26958.30 Geometrical product specifications (GPS).Filtration.Part 30:Robust profile filters.Basic concept*， 2017-02-28 Update
• GB/Z 26958.31 Geometrical Product Specifications (GPS).Filtration.Part 31: Robust profile filters.Gaussian regression filters
• GB/Z 26958.32 Geometrical Product Specifications (GPS).Filtration.Part 32: Robust profile filters: Spline filters
• GB/Z 26958.40 Geometrical Product Specifications (GPS). Filtration.Part 40: Morphological profile filters: Basic concepts
• GB/Z 26958.41 Geometrical Product Specifications (GPS).Filtration.Part 41: Morphological profile filters: Disk and horizontal segment filters
• GB/Z 26958.49 Geometrical Product Specifications (GPS).Filtration.Part 49: Morphological profile filters: Scale space techniques

GB/T 30860-2014 history

• 2014 GB/T 30860-2014 Test methods for surface roughness and saw mark of silicon wafers for solar cells