GB/T 15244-2013 Microbeam analysis.Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry (English Version)
This standard specifies the quantitative analysis method for silicate glass by X-ray spectrometer (WDS) and energy dispersive spectrometer (EDS) of electron probe apparatus (EPMA) and scanning electron microscope (SEM). This standard applies to the quantitative analysis of silicate glass samples (including silicate glass of alkali metals) by spectroscopy (WDX) and energy spectroscopy (EDX).
GB/T 15244-2013 Referenced Document
GB/T 17359-2012 Microbeam analysis.Quantitative analysis using energy dispersive spectrometry
GB/T 17366 Methods of mineral and rock specimen preparation for EPMA
GB/T 28634-2012 Microbeam analysis.Electron probe microanalysis.Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
GB/T 4930-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for the specification of certified reference materials(CRMs)
GB/T 15244-2013 history
2013GB/T 15244-2013 Microbeam analysis.Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry
2002GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis