GB/T 28634-2012 (English Version) PDF

Standard No.: GB/T 28634-2012
Language: Chinese, Available in English version
Release Date: 2012
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 28634-2012

Scope: This standard specifies the requirements for the quantitative analysis of the elements in the micron-scale volume of the sample by using the electron probe or the scanning electron microscope (SEM) spectrometer (WDS), through the X-rays generated by the interaction between the electron beam and the sample. Contents include: --Principles of quantitative analysis; --General ranges of elements, mass fractions and standard substances involved in this method; --General requirements for instruments; process and reporting. This standard is applicable to the vertical incidence of the electron beam, and the surface of the test block sample for quantitative analysis is required to be smooth and uniform. There are no special requirements for instruments and data processing software. Users should obtain instrument installation conditions, detailed operating procedures and instrument instructions from the instrument manufacturer.

GB/T 28634-2012 Referenced Document

GB/T 17359-2012 Microbeam analysis.Quantitative analysis using energy dispersive spectrometry
GB/T 27025-2008 General requirements for the competence of testing and calibration laboratories
GB/T 4930 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)*， 2021-05-21 Update
ISO 14594 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy*， 2014-10-01 Update

2012 GB/T 28634-2012 Microbeam analysis.Electron probe microanalysis.Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy