IEC 60749-10:2002/COR1:2003
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Standard No.

IEC 60749-10:2002/COR1:2003

Release Date

2003

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced

Replace By

IEC 60749-10:2022

Latest

IEC 60749-10:2022

Scope

This is Technical Corrigendum 1 to IEC 60749-10-2002 (Semiconductor devices -Mechanical and climatic test methods -Part 10: Mechanical shock)

IEC 60749-10:2002/COR1:2003 history

• 2022 IEC 60749-10:2022 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
• 2003 IEC 60749-10:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
• 2002 IEC 60749-10:2002 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock