IEC 60749-10:2022
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
- Standard No.
- IEC 60749-10:2022
- Release Date
- 2022
- Published By
- International Electrotechnical Commission (IEC)
- Latest
- IEC 60749-10:2022
IEC 60749-10:2022 history
- 2022 IEC 60749-10:2022 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
- 2003 IEC 60749-10:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
- 2002 IEC 60749-10:2002 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
