IEC 60749-5:2003
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Standard No.

IEC 60749-5:2003

Release Date

2003

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2017-04

Replace By

IEC 60749-5:2017

Latest

IEC 60749-5:2023 RLV

Replace

IEC 47/1661/FDIS:2002 IEC 60749:1996 IEC 60749 AMD 1:2000 IEC 60749 AMD 2:2001 IEC 60749 Edition 2.2:2002 IEC/PAS 62161:2000

Scope

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

IEC 60749-5:2003 history

• 0000 IEC 60749-5:2023 RLV
• 2017 IEC 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
• 2003 IEC 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

IEC 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test has been changed from IEC 60749:1996 Semiconductor devices - Mechanical and climatic test methods.