IEC 60749-1:2002
Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Standard No.

IEC 60749-1:2002

Release Date

2002

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced

Replace By

IEC 60749-1:2002/COR1:2003

Latest

IEC 60749-1:2002/COR1:2003

Replace

IEC 47/1638/FDIS:2002 IEC 60749:1996 IEC 60749 AMD 1:2000 IEC 60749 AMD 2:2001 IEC 60749 Edition 2.2:2002

Scope

This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. In the case of contradiction between this standard and a relevant procurement specification, the latter should govern.

IEC 60749-1:2002 history

• 2003 IEC 60749-1:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 1: General
• 2002 IEC 60749-1:2002 Semiconductor devices - Mechanical and climatic test methods - Part 1: General

IEC 60749-1:2002 Semiconductor devices - Mechanical and climatic test methods - Part 1: General has been changed from IEC 60749:1996 Semiconductor devices - Mechanical and climatic test methods.