IEC 60749-1:2002/COR1:2003
Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Standard No.

IEC 60749-1:2002/COR1:2003

Release Date

2003

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 60749-1:2002/COR1:2003

Scope

This standard is Semiconductor devices - Mechanical and climatic test methods - Part 1: General; Corrigendum 1.

IEC 60749-1:2002/COR1:2003 history

• 2003 IEC 60749-1:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 1: General
• 2002 IEC 60749-1:2002 Semiconductor devices - Mechanical and climatic test methods - Part 1: General