GB/T 18907-2002
Method of selected area electron diffraction for transmission electron microscopes (English Version)
- Standard No.
- GB/T 18907-2002
- Language
- Chinese, Available in English version
- Release Date
- 2002
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Status
- 2014-03
- Replace By
- GB/T 18907-2013
- Latest
- GB/T 18907-2013
- Scope
- This standard specifies the method for the selected area electron diffraction analysis of micron-scale regions of thin crystal samples by transmission electron microscopy. This method is suitable for electron diffraction analysis of various metal and non-metal crystal thin films (including powder samples and extracted replica samples). The smallest sample area that can be analyzed has a diameter of 1 μm. The crystal symmetry, lattice constant and Bravais lattice type data of the sample can be obtained by electron diffraction spectrum. The diffraction constant of the transmission electron microscope can be determined by using the electron diffraction spectrum of the known crystal thin film. When the diameter of the sample area to be analyzed is less than 1 μm, it can be implemented by reference.
GB/T 18907-2002 history
- 2013 GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
- 2002 GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
