BS EN ISO 12179:2001 PDF

Scope: This International Standard applies to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration is to be carried out with the aid of measurement standards. Annex B applies to the calibration of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.

BS EN ISO 12179:2001 Referenced Document

ISO ISO IEC 27001-2013 cor2-2015 technical errata*， 2024-04-17 Update
ISO 10012-1:1992 Quality assurance requirements for measuring equipment; part 1: metrological confirmation system for measuring equipment
ISO 12085:1996 Geometrical Product Specification (GPS) - Surface texture: Profile method - Motif parameters
ISO 14253-1:1998 Geometrical Product Specifications (GPS) - Inspection by measurement of workpieces and measuring equipments - Part 1: Decision rules for proving conformance or non-conformance with specifications
ISO 3274:1996 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments
ISO 4287:1997 Geometrical Product Specification (GPS) - Surface texture: Profile method - Terms, definitions and surface texture parameters
ISO 5436-1:2000 Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 1: Material measures
ISO/TS 14253-2:1999 Geometrical Product Specifications (GPS) - Inspection by measurement of workpieces and measuring equipment - Part 2: Guide to the estimation of uncertainty in GPS measurement, in calibration of measuring equipment and in product verification

2022 BS EN ISO 12179:2022 Geometrical product specifications (GPS). Surface texture: Profile method. Calibration of contact (stylus) instruments
2001 BS EN ISO 12179:2001 Geometrical product specifications (GPS). Surface texture. Profile method. Calibration of contact (stylus) instruments