Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
1975ISO 3274:1975 Instruments for the measurement of surface roughness by the profile method; Contact (stylus) instruments of consecutive profile transformation; Contact profile meters, system M