ISO 5436-1:2000
Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 1: Material measures

Standard No.
ISO 5436-1:2000
Release Date
2000
Published By
International Organization for Standardization (ISO)
Latest
ISO 5436-1:2000
Scope
This part of ISO 5436 specifies the characteristics of material measures used as measurement standards (etalons) for the calibration of metrological characteristics of instruments for the measurement of surface texture by the profile method as defined in ISO 3274.

ISO 5436-1:2000 Referenced Document

  • ISO 10012-1:1992 Quality assurance requirements for measuring equipment; part 1: metrological confirmation system for measuring equipment
  • ISO 12085:1996 Geometrical Product Specification (GPS) - Surface texture: Profile method - Motif parameters
  • ISO 3274:1996 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments
  • ISO 4287:1997 Geometrical Product Specification (GPS) - Surface texture: Profile method - Terms, definitions and surface texture parameters
  • ISO 4288:1996 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Rules and procedures for the assessment of surface texture
  • ISO/TS 14253-2:1999 Geometrical Product Specifications (GPS) - Inspection by measurement of workpieces and measuring equipment - Part 2: Guide to the estimation of uncertainty in GPS measurement, in calibration of measuring equipment and in product verification

ISO 5436-1:2000 history

  • 2000 ISO 5436-1:2000 Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 1: Material measures
Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 1: Material measures



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