IEC 60749-4:2002/COR1:2003
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 4: Damp Heat@ Steady State@ Highly Accelerated Stress Test (HAST) CORRIGENDUM 1 (Edition 1.0)

Standard No.

IEC 60749-4:2002/COR1:2003

Release Date

2003

Published By

IEC - International Electrotechnical Commission

Status

Be replaced 2017-03

Replace By

IEC 60749-4:2017

Latest

IEC 60749-4:2017

IEC 60749-4:2002/COR1:2003 history

• 2017 IEC 60749-4:2017 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
• 2003 IEC 60749-4:2002/COR1:2003 Semiconductor Devices - Mechanical and Climatic Test Methods - Part 4: Damp Heat@ Steady State@ Highly Accelerated Stress Test (HAST) CORRIGENDUM 1 (Edition 1.0)
• 2002 IEC 60749-4:2002 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)