GB/T 40066-2021
Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM) (English Version)

Standard No.
GB/T 40066-2021
Language
Chinese, Available in English version
Release Date
2021
Published By
国家市场监督管理总局、中国国家标准化管理委员会
Latest
GB/T 40066-2021
Scope
This standard specifies the sample preparation, measurement procedures and result calculation for measuring the thickness of graphene oxide by atomic force microscopy (AFM). This standard is applicable to the measurement of the thickness of graphene oxide whose diameter is not less than 300nm. The AFM measurement of the thickness of other two-dimensional materials can be used by reference.

GB/T 40066-2021 Referenced Document

  • GB/T 27760 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic steps
  • GB/T 30544.13 Nanotechnologies — Vocabulary — Part 13:Graphene and related two-dimensional (2D) materials
  • JJF 1351 Calibration Specification for Scanning Probe Microscopes

GB/T 40066-2021 history

  • 2021 GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)



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