This standard specifies the sample preparation, measurement procedures and result calculation for measuring the thickness of graphene oxide by atomic force microscopy (AFM). This standard is applicable to the measurement of the thickness of graphene oxide whose diameter is not less than 300nm. The AFM measurement of the thickness of other two-dimensional materials can be used by reference.
GB/T 40066-2021 Referenced Document
GB/T 27760 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic steps
GB/T 30544.13 Nanotechnologies — Vocabulary — Part 13:Graphene and related two-dimensional (2D) materials
JJF 1351 Calibration Specification for Scanning Probe Microscopes
GB/T 40066-2021 history
2021GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)