JJF 1351-2012 (English Version) PDF

Standard No.: JJF 1351-2012
Language: Chinese, Available in English version
Release Date: 2012
Published By: National Metrological Technical Specifications of the People's Republic of China
Latest: JJF 1351-2012

Scope: This specification is applicable to the calibration of scanning probe microscopes that take geometric surface topography as the measurement object. Scanning probe microscopes have different design principles, and relevant metrological characteristics need to be selected according to the actual situation during calibration. Measurement tasks with special requirements, such as measurements with high traceability requirements, are not within the scope of application of this calibration specification.

JJF 1351-2012 Referenced Document

GB/T 19067.1-2003 Geometrical product specifications(GPS)--Surface texture: Profile method measurement standards--Part 1: Material measures
JJF 1001-2011 General Terms in Metrology and Their Definitions

2012 JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
1970 JJF 1351-1990 14.8MeV Neutron Absorbed Dose Reference Operating Technical Specifications