GB/T 31092-2022 (English Version) PDF

Standard No.: GB/T 31092-2022
Language: Chinese, Available in English version
Release Date: 2022
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 31092-2022
Replace: GB/T 31092-2014

Scope: This document specifies the technical requirements, test methods, inspection rules, signs, packaging, transportation, storage, accompanying documents and order form for sapphire single crystal ingots. This document applies to substrates and sapphire single crystal ingots for optical purposes (hereinafter referred to as "ingots").

GB/T 31092-2022 Referenced Document

GB/T 14264 Semiconductor materials-Terms and definitions
GB/T 1958 Geometrical Product Specifications(GPS)—Geometrical tolerance—Verification
GB/T 31093 Test method for stress of monocrystalline sapphire ingot
GB/T 33236 Polycrystalline silicon—Determination of trace elements—Glow discharge mass spectrometry method
GB/T 33763 Test method for dislocation density of sapphire single crystal
GB/T 34210 Test method for determining the orientation of sapphire single crystal
GB/T 34612 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals
GB/T 7962.12 Test methods of colourless optical glass.Part 12:Spectral internal transmittance