GB/T 31092-2014
Monocrystalline sapphire ingot (English Version)
- Standard No.
- GB/T 31092-2014
- Language
- Chinese, Available in English version
- Release Date
- 2014
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Status
- 2023-07
- Replace By
- GB/T 31092-2022
- Latest
- GB/T 31092-2022
- Scope
- This standard specifies the requirements, inspection methods, inspection rules and signs, packaging, transportation, storage and quality certificates, purchase orders (or contracts) for sapphire single crystal ingots. This standard applies to sapphire single crystal ingots, which can be used to manufacture gallium nitride epitaxial thin films and sapphire single crystal substrate materials for other purposes (hereinafter referred to as ingots).
GB/T 31092-2014 Referenced Document
- GB/T 14264 Semiconductor materials-Terms and definitions
- GB/T 1554 Testing method for crystallographic perfection of silicon by preferential etch techniques
- GB/T 1555 Method for Determination of Crystalline Orientation of Semiconductor Single Crystal*， 2023-08-06 Update
- GB/T 2828.1 Inspection procedure by count sampling part 1: Lot by lot inspection sampling plan retrieved by acceptance quality limit (AQL)
GB/T 31092-2014 history
- 2022 GB/T 31092-2022 Monocrystalline sapphire bar
- 2014 GB/T 31092-2014 Monocrystalline sapphire ingot
