SJ/T 2658.16-2016
Measuring method for semiconductor infrared-emitting diode.Part 16: Photo-electric conversion efficiency (English Version)

Standard No.

SJ/T 2658.16-2016

Language

Chinese, Available in English version

Release Date

2016

Published By

Professional Standard - Electron

Latest

SJ/T 2658.16-2016

Scope

This part specifies the measurement principle diagram, measurement steps and specified conditions for the photoelectric conversion efficiency of semiconductor infrared emitting diodes (hereinafter referred to as devices). This section applies to semiconductor infrared emitting diodes.

SJ/T 2658.16-2016 Referenced Document

• SJ/T 2658.1 Measuring method for semiconductor infrared-emitting diode.Part 1: General
• SJ/T 2658.6 Measuring method for semiconductor infrared-emitting diode.Part 6: Radiant power

SJ/T 2658.16-2016 history

• 2016 SJ/T 2658.16-2016 Measuring method for semiconductor infrared-emitting diode.Part 16: Photo-electric conversion efficiency