- Standard No.
- SJ/T 2658.6-2015
- Language
- Chinese, Available in English version
- Release Date
- 2015
- Published By
- Professional Standard - Electron
- Latest
-
SJ/T 2658.6-2015
- Replace
-
SJ 2658.6-1986
- Scope
- This part specifies the measurement principle diagram, measurement steps and specified conditions for the radiation power of semiconductor infrared emitting diodes (hereinafter referred to as devices). This section applies to semiconductor infrared emitting diodes.
SJ/T 2658.6-2015 Referenced Document
- GB/T 2900.65-2004 Electrotechnical terminology-Lighting
- SJ/T 2658.1 Measuring method for semiconductor infrared-emitting diode.Part 1: General
SJ/T 2658.6-2015 history
- 2015 SJ/T 2658.6-2015 Measuring method for semiconductor infrared-emitting diode.Part 6: Radiant power
- 1970 SJ 2658.6-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for output optical power
SJ/T 2658.6-2015 Measuring method for semiconductor infrared-emitting diode.Part 6: Radiant power has been changed from SJ 2658.6-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for output optical power.